4D Technology

4D Inspec

4D Inspec Surface Gauge는 최초의 휴대용 비접촉식 정밀 측정 기구입니다. 마이크로미터 레벨의 화질, 휴대성, 사용 편의성을 갖춘 4D Inspec은 어떤 환경에서나 고화질의 측정을 가능케 합니다.

또한 5㎛ ~ 2.5㎜ 깊이의 패임, 흠집, 요철 등을 3D로 측정 가능하며, 빈틈 없는 모서리나 넓은 표면을 가진 샘플도 측정할 수 있는 휴대성을 지니고 있습니다.


Basic Specifications

Instantaneous, non-contact 3D surface measurement

Measurable Range
Defects and features 0.0002–0.1 in (5 µm–2.5 mm) deep/tall

Field of View ( module)
0.3 x 0.3 in (7.7 x 7.7 mm)

Lateral Sampling
Lateral Sampling 0.00026 in (6.6 µm)

Vertical Resolution
0.0001 in (2.5 µm)

Handheld or workstation mounted

Standoff Distance
1.4 in (35 mm)


4D InSpec control and analysis software

Measurement Modes
Single snapshot; enhanced resolution multi-snapshot mode

Defect Detection
Identify features based on height and area thresholds

Defect Calculations
Max height, volume, area, max slope, density, aspect ratio, XY location

Data Displays
Contour, 3D, XY slice with arbitrary cursors

Data Output
Tabular feature analysis statistics with 3D surface maps

Data Masking
Masking based on signal to noise ratio; rectangular ROI masks for analysis

Import and Export
Export data to XYZ point cloud


11 x 2 x 2.8 in (280 mm x 50 mm x 70 mm)

Light Source
450 nm LED with 100,000 hour MTBF

1200 x 1200 pixel, 12-bit scientific CMOS camera

Power Consumption
< 10 W 4D InSpec unit; < 250 W with computer system @ 120 VAC

< 2 lbs (0.9 kg) instrument only

Cable Length
10 ft (3 m )

Operating Temperature
50–86° F (10–30° C)

Operating Humidity
> 98% non-condensing


Noise Floor
< 0.0001 in (2.5 µm) *Average Ra of difference between two measurements on 4D calibration sample.

Vertical Repeatability
< 0.000024 in (0.6 µm) *1σ Ra for 30 measurements on 4D calibration sample.

Step Height Accuracy
< 2% *Difference vs. PTB-certified values sample for features from 0.00039-0.035 in (100-900 µm) tall.

Step Repeatability
< 0.5%

Depth of Focus
> 0.10 in (2.5 mm)

Minimum Part Roughness
5 µin (120 nm) Ra